Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET
نویسندگان
چکیده
منابع مشابه
Negative Bias Temperature Instability in CMOS Devices
This paper reviews the experimental and modeling efforts to understand the mechanism of Negative Bias Temperature Instability (NBTI) in p-MOSFETs, which is becoming a serious reliability concern for analog and digital CMOS circuits. Conditions for interface and bulk trap generation and their dependence on stress voltage and oxide field, temperature and time are discussed. The role of inversion ...
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In spite of 50 years of history, there is still no consensus on the basic physics of Negative Bias Temperature Instability. Two competing models, Reaction-Diffusion and Defect-Centric, currently vie for dominance. The differences appear fundamental: one model holds that NBTI is a diffusion-limited process and the other holds that it is reaction-limited. Basic issues of disagreement are summariz...
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After its discovery nearly forty years ago, negative bias temperature instability (NBTI) has again moved to the center of scientific attention as a significant reliability concern for highly scaled pMOSFETs. 3 The concern stems from the large number of unsaturated dangling bonds (Pb centers ) at the Si/SiO2 interface, which have to be passivated in order to avoid trapping levels in the bandgap....
متن کاملNegative Bias Temperature Instability by Body Bias on Ring Oscillators in Thin BOX Fully-Depleted Silicon on Insulator Process
Body Bias (BB) control on Silicon On Insulator (SOI) mitigates power consumption on the stand-by mode. However, Negative Bias Temperature Instability (NBTI) changes by BB. We measure the NBTI of ring oscillators on thin buried oxide (BOX) fully-depleted SOI process. NBTI is suppressed and power consumption becomes lower by applying Reverse BB (RBB) because larger threshold voltage decreases car...
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We report on anomalous output characteristics observed in hydrodynamic simulations of partially depleted SOI MOSFETs. The effect that the drain current reaches a maximum and then decreases is peculiar to the hydro-dynamic transport model. It is not present in drift-diffusion simulations and its occurance in measurements is questionable. The problem is investigated under various conditions and a...
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ژورنال
عنوان ژورنال: IEEE Access
سال: 2020
ISSN: 2169-3536
DOI: 10.1109/access.2020.2997463